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Pages: 467
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Type: BOOK - Published: 2013-10-22 - Publisher: Academic Press

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Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology.
Semiconductor Measurement Technology
Language: en
Pages: 60
Authors: John R. Devaney
Categories: Miniature electronic equipment
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh Univ
Characterization of Semiconductor Heterostructures and Nanostructures
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Semiconductor Characterization
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Authors: W. Murray Bullis
Categories: Science
Type: BOOK - Published: 1996 - Publisher: American Institute of Physics

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Market: Those in government, industry, and academia interested in state-of-the-art knowledge on semiconductor characterization for research, development, and ma