Nonlinear Characterization of Microwave Transistors by the Means of Pulsed I(V) and Pulsed S-Parameters Measurements
Author | : |
Publisher | : |
Total Pages | : |
Release | : 1910 |
ISBN-10 | : OCLC:667170849 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Download or read book Nonlinear Characterization of Microwave Transistors by the Means of Pulsed I(V) and Pulsed S-Parameters Measurements written by and published by . This book was released on 1910 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: A versatile pulsed I(V) and 40 GHz pulsed S parameters measurement system of microwave transistors is described Capability of discrimination between thermal and trapping effects with a pulse set-up is demonstrated A method to measure electrically the thermal resistance and capacitance of transistors with a pulse set-up is proposed Finally, it is explained how to derive transistor nonlinear characteristics from these measurements for modeling purposes.