Electrical Characterization of GaAs Materials and Devices

Electrical Characterization of GaAs Materials and Devices
Author :
Publisher :
Total Pages : 280
Release :
ISBN-10 : OCLC:1330351297
ISBN-13 :
Rating : 4/5 ( Downloads)

Book Synopsis Electrical Characterization of GaAs Materials and Devices by : David C. Look

Download or read book Electrical Characterization of GaAs Materials and Devices written by David C. Look and published by . This book was released on 1992 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt:


Electrical Characterization of GaAs Materials and Devices Related Books

Electrical Characterization of GaAs Materials and Devices
Language: en
Pages: 280
Authors: David C. Look
Categories: Gallium arsenide semiconductors
Type: BOOK - Published: 1992 - Publisher:

DOWNLOAD EBOOK

Electrical Characterization of GaAs Materials and Devices
Language: en
Pages: 290
Authors: David C. Look
Categories: Technology & Engineering
Type: BOOK - Published: 1992-07-14 - Publisher: Wiley

DOWNLOAD EBOOK

Summarizes electrical measurement data in GaAs materials and devices, and describes in detail the techniques used to obtain these data and the ideas behind them
GaAs High-Speed Devices
Language: en
Pages: 632
Authors: C. Y. Chang
Categories: Technology & Engineering
Type: BOOK - Published: 1994-10-28 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

The performance of high-speed semiconductor devices—the genius driving digital computers, advanced electronic systems for digital signal processing, telecommu
Materials for High-Temperature Semiconductor Devices
Language: en
Pages: 136
Authors: Committee on Materials for High-Temperature Semiconductor Devices
Categories: Technology & Engineering
Type: BOOK - Published: 1995-09-28 - Publisher: National Academies Press

DOWNLOAD EBOOK

Major benefits to system architecture would result if cooling systems for components could be eliminated without compromising performance. This book surveys the
Semiconductor Material and Device Characterization
Language: en
Pages: 648
Authors: Dieter K. Schroder
Categories: Technology & Engineering
Type: BOOK - Published: 1990-07-04 - Publisher: Wiley-Interscience

DOWNLOAD EBOOK

The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough