Characterization of Cubic Silicon Carbide Epitaxial Layers Crystallized on Silicon Substrates by Cvd Method
| Author | : Dominika Teklińska |
| Publisher | : |
| Total Pages | : |
| Release | : 2017 |
| ISBN-10 | : OCLC:1183358890 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Characterization of Cubic Silicon Carbide Epitaxial Layers Crystallized on Silicon Substrates by Cvd Method by : Dominika Teklińska
Download or read book Characterization of Cubic Silicon Carbide Epitaxial Layers Crystallized on Silicon Substrates by Cvd Method written by Dominika Teklińska and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Dotyczy: silikon carbide, 3C-SiC, silicon, epitaxy, epitaxial layers, CVD, węglik krzemu, krzem, epitaksja, warstwy epitaksjalne.
