Nonlinear Device Measurement, Characterization, and Modeling for High Power RF Applications
Author | : Youngseo Ko |
Publisher | : |
Total Pages | : 122 |
Release | : 2013 |
ISBN-10 | : OCLC:872583405 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Download or read book Nonlinear Device Measurement, Characterization, and Modeling for High Power RF Applications written by Youngseo Ko and published by . This book was released on 2013 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt: Having characterized results under the developedmeasurement system, a new measurement based model with artificial neuron network (ANN) is finally proposed and applied to a SOI MOSFET device. The verification results demonstrate that the time-consuming measurement process can be dramatically reduced by using RTALP measurement data, and that fairly accurate large-signal RF device model can be easily extracted from these measurements using the ANN approach.