Hot-carrier Reliability, Effective Carrier Mobility, and 1/f Noise Properties of Thin-film Silicon-on-insulator (TFSOI) MOSFETs
| Author | : Janet Siao-Yian Wang |
| Publisher | : |
| Total Pages | : 312 |
| Release | : 1995 |
| ISBN-10 | : OCLC:36563317 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Hot-carrier Reliability, Effective Carrier Mobility, and 1/f Noise Properties of Thin-film Silicon-on-insulator (TFSOI) MOSFETs by : Janet Siao-Yian Wang
Download or read book Hot-carrier Reliability, Effective Carrier Mobility, and 1/f Noise Properties of Thin-film Silicon-on-insulator (TFSOI) MOSFETs written by Janet Siao-Yian Wang and published by . This book was released on 1995 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt:
