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High-Resolution X-Ray Scattering
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Pages: 432
Authors: Ullrich Pietsch
Categories: Technology & Engineering
Type: BOOK - Published: 2004-08-27 - Publisher: Springer Science & Business Media

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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industr
High-Resolution X-Ray Scattering
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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industr
High Resolution X-Ray Diffractometry And Topography
Language: en
Pages: 263
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Type: BOOK - Published: 1998-02-05 - Publisher: CRC Press

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The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these mat
Thin Film Analysis by X-Ray Scattering
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With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of m
Synchrotron Light Sources and Free-Electron Lasers
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Hardly any other discovery of the nineteenth century did have such an impact on science and technology as Wilhelm Conrad Röntgen’s seminal find of the X-rays