17th Ieee Vlsi Test Symposium
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Language: en
Pages: 534
Pages: 534
Type: BOOK - Published: 1999 - Publisher: Institute of Electrical & Electronics Engineers(IEEE)
The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer tec
Language: en
Pages: 498
Pages: 498
Type: BOOK - Published: 2005 - Publisher:
Language: en
Pages: 528
Pages: 528
Type: BOOK - Published: 2000 - Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and sys
Language: en
Pages: 458
Pages: 458
Type: BOOK - Published: 2001 - Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are dis
Language: en
Pages: 490
Pages: 490
Type: BOOK - Published: 2017-12-19 - Publisher: CRC Press
Recently the world celebrated the 60th anniversary of the invention of the first transistor. The first integrated circuit (IC) was built a decade later, with th
